ACTOPROBE LLC designs, manufactures, and sells custom optical Spectroscopy/Microscopy Instruments and AFM Probes for conventional AFM to do single molecular spectroscopy of biomedical specimens and compound semiconductor material & devices. The company was founded in March 2009.
We provide you with an accessory to your existing AFM to do optical microscopy and spectroscopy on a single molecular level. Also, we offer you the most affordable AFM if you need one.
DOE SBIR PHASE IIA. On May 28, 2019, Actoprobe was awarded a $1,000,000 Department of Energy (DOE) Phase IIA SBIR grant to develop Ultrafast Active AFM Optical Probe (AAOP).
NEW MEXICO’s SBIR AWARD MATCHNIG GRANT. On December 2018 Actoprobe was awarded a $50,000 grant from The New Mexico Economic Development Department.
Information not available by other comparable techniques.
Improved optical resolution and signal-to-noise ratio.
Convenient measurement and time savings: self-alignment.
No need to spend extra money on a far-field optical microscope.
Founder of Actoprobe. Over 30 years of experience working in the field of optoelectronics and microscopy.
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Expert in the Physical Chemistry of Biomolecules and Molecular Biology with more than 30 years of research experience, including 18 years with the Department of Molecular Biology at Princeton University.
Expert in semiconductor lasers and FDTD simulation. Over 30 years of experience in the field of optoelectronics and microscopy
Novel semiconductor-laser-integrated active AFM optical probe with ultrashort pulses and nanoscale aperture is demonstrated with 3.5 ps pulse width and 11.4 GHz repetition rate.
We have demonstrated a novel type of AFM probe – Ultra-Fast AFM Active Optical Probe (UFP AAOP) by monolithically integrating a mode-locked diode laser and AFM tip.
Actoprobe team had developed custom Tip Enhancement Raman Spectroscopy System (TERS) with specially developed Ultra High Aspect Ratio probes for AFM and TERS measurements for small pixel infrared FPA sidewall haracterization.
We propose to utilize confocal Raman spectroscopy combined with high-resolution atomic force microscopy (AFM) for nondestructive characterization of the sidewalls of etched and passivated small pixel focal plane arrays (FPA) fabricated using LW/LWIR InAs/GaSb type-II strained-layer superlattice (T2SL) detector material.
A new monolithic Atomic Force Microscopy ( AFM ) active optical probe monolithically integrates a base of the probe, a cantilever, a semiconductor laser source, an AFM tip, and a photodetector into a robust, easy-to-use single semiconductor chip to enable AFM measurements, optical imaging, and optical spectroscopy at the nanoscale.
A new resonant-cavity-enhanced Atomic Force Microscopy (AFM) active optical probe integrates a semiconductor laser source and an aperture AFM/near-field scanning optical microscopy (NSOM) probe in either external-resonant-cavity or internal-resonant-cavity configuration to enable both conventional AFM measurements and optical imaging and spectroscopy at the nanoscale.
A new active optical Atomic Force Microscopy (AFM) probe integrating monolithically a semiconductor laser source, an AFM tip, and a photodetector into a robust, easy-to use single semiconductor chip to enable both conventional AFM measurements and optical imaging and spectroscopy at the nanoscale.