SPIE DSS 2015  is held annually in Baltimore, Maryland and hosts the most important technical conferences and exhibition on optics, imaging, and sensing for defense, security, industry, health, and the environment.

On April 21, at 2:20 pm, Thomas J. Rotter will be presenting a paper titled ” Confocal Raman spectroscopy and AFM for evaluation of sidewalls in type-II superlattices” at this premier event.

Interested parties can access a link to the presentation (.pdf).