Actoprobe Secures U.S. Patent for Integrated III‑V/Silicon AFM Active Optical Probe
Albuquerque, N.M. — Actoprobe has been granted U.S. Patent No. 12,072,351 B1 for its Integrated III‑V/Silicon Atomic Force Microscopy (AFM) Active Optical Probe. This single III‑V/silicon chip combines a III-V semiconductor laser with a silicon-cantilever AFM probe to deliver co-located AFM, optical imaging, and spectroscopy at the nanoscale. The invention simplifies alignment, hardens the probe […]